Draft
International StandardISO/DIS 11505
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Reference number
ISO/DIS 11505
ISO/DIS 11505
Edition 2
© ISO 2025
Projet Norme internationale
ISO/DIS 11505
87870
Projet de Norme internationale au stade enquête auprès des membres de l’ISO.
Remplacera ISO 11505:2012
Résumé
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
Informations générales
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État actuel: ProjetStade: Clôture du vote [40.60]
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Edition: 2
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Comité technique :ISO/TC 201/SC 8ICS :71.040.40
- RSS mises à jour
Cycle de vie
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Précédemment
PubliéeISO 11505:2012
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Actuellement
