Reference number
ISO 29301:2023
International Standard
ISO 29301:2023
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
Edition 3
2023-10
Preview
ISO 29301:2023
86942
Indisponible en français
Publiée (Edition 3, 2023)

ISO 29301:2023

ISO 29301:2023
86942
Langue
Format
CHF 173
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Résumé

This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon.

This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar.

This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

Informations générales

  •  : Publiée
     : 2023-10
    : Norme internationale publiée [60.60]
  •  : 3
  • ISO/TC 202/SC 3
    37.020 
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