Numéro de référence
ISO 29301:2010
ISO 29301:2010
Analyse par microfaisceaux — Microscopie électronique en transmission analytique — Méthodes d'étalonnage du grandissement d'image au moyen de matériaux de référence de structures périodiques
Edition 1
2010-06
Annulée
ISO 29301:2010
45399
Annulée (Edition 1, 2010)

Résumé

ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)

Informations générales

  •  : Annulée
     : 2010-06
    : Annulation de la Norme internationale [95.99]
  •  : 1
  • ISO/TC 202/SC 3
    37.020 
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