ISO/AWI 12179
Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments
Reference number
ISO/AWI 12179
Edición 3
© ISO 2024
Working draft
En desarrollo
Un grupo de trabajo ha preparado un borrador.
Reemplazará ISO 12179:2021

Resumen

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.

Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

Informaciones generales

  • Estado
     : En desarrollo
    Etapa
    : Nuevo proyecto registrado en el programa de trabajo TC/SC [20.00]
  • Edición
     : 3
  • Comité Técnico :
    ISO/TC 213
  • RSS actualizaciones

Ciclo de vida

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

  2. Tienda
  3. Standards catalogue
  4. TC
  5. ISO/TC 213
  6. ISO/AWI 12179