ISO/TS 17915:2013
Optics and photonics — Measurement method of semiconductor lasers for sensing
Reference number
ISO/TS 17915:2013
Edición 1
2013-07
Retirada
ISO/TS 17915:2013
60988
Retirada (Edición 1, 2013)

Resumen

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

Informaciones generales

  •  : Retirada
     : 2013-07
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 27
  • ISO/TC 172/SC 9
    31.260 
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