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Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 1 Secretaría Etapa ICS
Microbeam analysis — Analytical electron microscopy — Vocabulary
90.60
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
40.99
Microbeam analysis — Scanning electron microscopy — Vocabulary
95.99
Microbeam analysis — Scanning electron microscopy — Vocabulary
90.20
Microbeam Analysis — Electron Backscatter Diffraction — Vocabulary
30.20
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
95.99
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
90.60

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